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Disambiguation of "Park, Jong Tae"

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Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs.

, , , and . Microelectron. Reliab., 55 (9-10): 1456-1459 (2015)

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Tae-jong Yang

Jong-Mi Park

Hyun-Jong Park

Tae Seok Park

Tae-Sik Park

 

Other publications of authors with the same name

Semantic Query Processing in Object-Oriented Database Systems., and . DASFAA, volume 2 of Advanced Database Research and Development Series, page 11-20. World Scientific, (1991)Localization of Wi-Fi Access Point Using Smart Phone's GPS Information., , , and . IEICE Trans. Commun., 96-B (1): 305-308 (2013)Fast Mobility Management for Delay-Sensitive Applications Using Multiple Tunnels in Vehicular Networks., and . IEICE Trans. Commun., 95-B (5): 1689-1701 (2012)Managing the New Telecommunications Paradigms: A Report on APNOMS'98., , , and . J. Netw. Syst. Manag., 6 (4): 497-500 (1998)Fast Mobility Management for Delay-Sensitive Applications in Vehicular Networks., and . IEEE Commun. Lett., 15 (1): 31-33 (2011)Effects of device layout on the drain breakdown voltages in MuGFETs., , and . Microelectron. Reliab., 51 (9-11): 1547-1550 (2011)Wire width dependence of hot carrier degradation in silicon nanowire gate-all-around MOSFETs., and . Microelectron. Reliab., 55 (9-10): 1438-1441 (2015)The optimum fin width in p-MuGFETs with the consideration of NBTI and hot carrier degradation., , and . Microelectron. Reliab., 50 (9-11): 1316-1319 (2010)NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs., , , , , , , and . Microelectron. Reliab., 49 (9-11): 1044-1047 (2009)Device instability of amorphous InGaZnO thin film transistors with transparent source and drain., , , and . Microelectron. Reliab., (2016)