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SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Nonlinear Codes for Control Flow Checking., and . ETS, page 1-6. IEEE, (2020)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community., , , , , , , and . ETS, page 1-10. IEEE, (2020)HATE: a HArdware Trojan Emulation Environment for Microprocessor-based Systems., , , , , and . IOLTS, page 109-114. IEEE, (2019)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)