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LFSR-Based Generation of Partially-Functional Broadside Tests.

. IEEE Trans. Computers, 65 (8): 2659-2664 (2016)

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Functional Broadside Tests with Minimum and Maximum Switching Activity., and . J. Low Power Electron., 4 (3): 429-437 (2008)Multicycle Tests With Fault Detection Test Data for Improved Logic Diagnosis.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (5): 1587-1591 (2022)Maximal Independent Fault Set for Gate-Exhaustive Faults.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 598-602 (2021)Storage-Based Logic Built-in Self-Test With Multicycle Tests.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3553-3557 (2022)Vector-restoration-based static compaction using random initial omission., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (11): 1587-1592 (2004)Pass/Fail Data for Logic Diagnosis Under Bounded Transparent Scan.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4862-4872 (2022)Two-Dimensional Test Generation Objective.. ATS, page 108-113. IEEE, (2022)Usable Circuits with Imperfect Scan Logic.. ATS, page 156-161. IEEE, (2022)A Functional Fault Model with Implicit Fault Effect Propagation Requirements., , and . ATS, page 95-102. IEEE, (2006)To Overtest Or Not To Overtest - More Questions Than Answers.. ATS, page 125. IEEE, (2006)