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A Functional-Level Test Generation Methodology Using Two-level Representations.

, and . DAC, page 722-725. ACM Press, (1989)

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High-Level Controllability and Observability Analysis for Test Synthesis., and . J. Electron. Test., 13 (2): 93-103 (1998)Improving a nonenumerative method to estimate path delay fault coverage., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 16 (7): 759-762 (1997)Hierarchical test generation under architectural level functional constraints., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (9): 1144-1151 (1996)Test compaction for sequential circuits., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (2): 260-267 (1992)A genetic algorithm framework for test generation., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 16 (9): 1034-1044 (1997)The evolution of dependable computing at the University of Illinois., , , and . IFIP Congress Topical Sessions, volume 156 of IFIP, page 135-164. Kluwer/Springer, (2004)Parallel Garbage Collection on a Virtual Memory System., and . ICPP, page 243-246. Pennsylvania State University Press, (1987)Analysis of Multiprocessors with Private Cache Memories.. IEEE Trans. Computers, 31 (4): 296-304 (1982)Performance of Processor-Memory Interconnections for Multiprocessors.. IEEE Trans. Computers, 30 (10): 771-780 (1981)A Parallel Processing Architecture for an Integrated Vision System., and . ICPP (1), page 383-387. Pennsylvania State University Press, (1988)