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A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , and 1 other author(s). IEEE Trans. Computers, 72 (5): 1447-1459 (May 2023)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip., , , , , and . ITC, page 646-649. IEEE, (2022)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , and . DDECS, page 1-6. IEEE, (2019)Optimized embedded memory diagnosis., , , , , , , , and . DDECS, page 347-352. IEEE Computer Society, (2011)A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip., , , , , , and . LATS, page 1-6. IEEE, (2022)Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores., , , , , , and . ITC, page 379-385. IEEE Computer Society, (2003)About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics., , , , , and . IOLTS, page 1-7. IEEE, (2023)A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , and . MTDT, page 12-16. IEEE Computer Society, (2002)