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Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set.

, , , и . ITC, стр. 1-7. IEEE, (2017)

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Tina Kapur

Rohit Sinha

Aphrodite Kapurniotu

Malak Basheshar Kapur

Rohit Gupta

 

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Functional Approaches to Generating Orderings for Efficient Symbolic Representations., , и . DAC, стр. 624-627. IEEE Computer Society Press, (1992)Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes., и . IEEE Trans. Computers, 41 (12): 1580-1588 (1992)Fast functional evaluation of candidate OBDD variable orderings., , , и . EURO-DAC, стр. 4-10. EEE Computer Society, (1991)An ATE assisted DFD technique for volume diagnosis of scan chains., , , и . DAC, стр. 31:1-31:6. ACM, (2013)Speed Binning with Path Delay Test in 150-nm Technology., , и . IEEE Des. Test Comput., 20 (5): 41-45 (2003)Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment., , , и . IEEE Trans. Very Large Scale Integr. Syst., 23 (7): 1185-1195 (2015)DFT MAX and Power., , , , , , , , , и 2 other автор(ы). J. Low Power Electron., 3 (2): 199-205 (2007)Evaluation of Entropy Driven Compression Bounds on Industrial Designs., , , , и . ATS, стр. 13-18. IEEE Computer Society, (2008)Not All Xs are Bad for Scan Compression., и . ATS, стр. 7-12. IEEE Computer Society, (2008)Manufacturing Test of SoCs., и . Asian Test Symposium, стр. 317-319. IEEE Computer Society, (2002)