( en | de | ru )

 

Disambiguation of "Yun, Sang-Yun"

Author of the publication

copydeleteadd this publication to your clipboard
The Method to Measure Si Thickness for Bond Line Thickness.

, , , and . ICPRAM, page 273-275. SciTePress, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yun-sang Kim

Jong-Mo Yun

Jaeman Yun

Hyong-Sik Yun

Yong-Seon Yun

 

Other publications of authors with the same name

BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel., , , , , , , , , and 5 other author(s). IEEE J. Solid State Circuits, 44 (11): 2987-2998 (2009)Corrections to "Efficient Day-Ahead Scheduling Voltage Control Scheme of ULTC and Var of Distributed Generation in Distribution System"., , , and . IEEE Access, (2023)A Defect Inspection Method for Machine Vision Using Defect Probability Image with Deep Convolutional Neural Network., , , , , and . ACCV (1), volume 11361 of Lecture Notes in Computer Science, page 142-154. Springer, (2018)The Method to Measure Si Thickness for Bond Line Thickness., , , and . ICPRAM, page 273-275. SciTePress, (2018)Efficient Day-Ahead Scheduling Voltage Control Scheme of ULTC and Var of Distributed Generation in Distribution System., , , and . IEEE Access, (2021)Protection System for LVDC Distribution Networks Using a Fault Current-Limiting Converter and Protection Zones., , and . IEEE Access, (2023)Detection and Location of Open Conductor Faults for Power Distribution Networks Using a Contingency Analysis Approach., , , , and . IEEE Access, (2024)A new approach for rapid urban flood mapping using ALOS-2/PALSAR-2 in 2015 Kinu River Flood, Japan., , and . IGARSS, page 1880-1883. IEEE, (2017)Influence of Raman Spectrometer Collection Efficiency on Performance of Noninvasive Blood Glucose Detection for Device Miniaturization., , , , and . EMBC, page 6139-6142. IEEE, (2020)Deep Learning-based Damage Mapping with InSAR Coherence Time Series., , , , , , and . CoRR, (2021)