Author of the publication

Wafer Defect Detection Using Directional Morphological Gradient Techniques.

, , and . EURASIP J. Adv. Signal Process., 2002 (7): 686-703 (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Detection and labeling of retinal vessels for longitudinal studies., , and . ICIP (3), page 164-167. IEEE Computer Society, (1995)Wafer Defect Detection Using Directional Morphological Gradient Techniques., , and . EURASIP J. Adv. Signal Process., 2002 (7): 686-703 (2002)