B. Wang, M. Ester, Y. Liao, J. Bu, Y. Zhu, Z. Guan, and D. Cai. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 1895--1904. New York, NY, USA, ACM, (2016)
Y. Liu, C. Liu, B. Liu, M. Qu, and H. Xiong. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 1015--1024. New York, NY, USA, ACM, (2016)
H. Li, Y. Ge, R. Hong, and H. Zhu. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 975--984. New York, NY, USA, ACM, (2016)
M. Bressan, S. Leucci, A. Panconesi, P. Raghavan, and E. Terolli. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 745--754. New York, NY, USA, ACM, (2016)
B. Perozzi, M. Schueppert, J. Saalweachter, and M. Thakur. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 569--578. New York, NY, USA, ACM, (2016)
F. Zhang, N. Yuan, D. Lian, X. Xie, and W. Ma. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 353--362. New York, NY, USA, ACM, (2016)
L. Tang, B. Long, B. Chen, and D. Agarwal. Proceedings of the 22Nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, page 283--292. New York, NY, USA, ACM, (2016)
D. Yang, J. He, H. Qin, Y. Xiao, and W. Wang. Proceedings of the 24th ACM International on Conference on Information and Knowledge Management, page 463--472. New York, NY, USA, ACM, (2015)
M. Jang, C. Faloutsos, S. Kim, U. Kang, and J. Ha. Proceedings of the 25th ACM International on Conference on Information and Knowledge Management, page 629--638. New York, NY, USA, ACM, (2016)
J. Bao, Y. Zheng, and M. Mokbel. Proceedings of the 20th International Conference on Advances in Geographic Information Systems, page 199--208. New York, NY, USA, ACM, (2012)
H. Ma, H. Yang, M. Lyu, and I. King. Proceedings of the 17th ACM Conference on Information and Knowledge Management, page 931--940. New York, NY, USA, ACM, (2008)