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Opportunities for next-generation optical access.
Dirk Breuer, Frank Geilhardt, Ralf Hülsermann, Mario Kind, Christoph Lange, Thomas Monath, and Erik Weis IEEE Communications Magazine (2011)
to dblp by dblp on Feb 13, 2012, 12:00 AM
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Typed Assembler for a RISC Crypto-Processor.
Peter T. Breuer, and Jonathan P. Bowen ESSoS, volume 7159 of Lecture Notes in Computer Science, page 22-29. Springer, (2012)
to dblp by dblp on Feb 10, 2012, 12:00 AM
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Obstacles and an approach towards concurrent engineering.
Melvin A. Breuer ITC, page 260-261. IEEE Computer Society, (1990)
to dblp by dblp on Feb 9, 2012, 12:00 AM
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On the charge sharing problem in CMOS stuck-open fault testing.
Kuen-Jong Lee, and Melvin A. Breuer ITC, page 417-426. IEEE Computer Society, (1990)
to dblp by dblp on Feb 9, 2012, 12:00 AM
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Error Rate Estimation for Defective Circuits via Ones Counting.
Zhaoliang Pan, and Melvin A. Breuer ACM Trans. Design Autom. Electr. Syst. 17(1):8 (2012)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Concurrent Control of Multiple BIT Structures.
Sandeep K. Gupta, Melvin A. Breuer, and Jung-Cheun Lien ITC, page 431-442. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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A Test and Maintenance Controller for a Module Containing Testable Chips.
Melvin A. Breuer, and Jung-Cheun Lien ITC, page 502-513. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Switch-level delay test.
Suriyaprakash Natarajan, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 171-180. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Test generation for crosstalk-induced delay in integrated circuits.
Wei-Yu Chen, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 191-200. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Test generation in VLSI circuits for crosstalk noise.
Weiyu Chen, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 641-650. IEEE Computer Society, (1998)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs.
Weiyu Chen, Melvin A. Breuer, and Sandeep K. Gupta ITC, page 809-818. IEEE Computer Society, (1997)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Process-Aggravated Noise PAN: New Validation and Test Problems.
Melvin A. Breuer, and Sandeep K. Gupta ITC, page 914-923. IEEE Computer Society, (1996)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Control Strategies for Chip-Based DFT/BIST Hardware.
Debaditya Mukherjee, Massoud Pedram, and Melvin A. Breuer ITC, page 893-902. IEEE Computer Society, (1994)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Novel Test Pattern Generators for Pseudo-Exhaustive Testing.
Rajagopalan Srinivasan, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 1041-1050. IEEE Computer Society, (1993)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Optimal Sequencing of Scan Registers.
Sridhar Narayanan, Charles Njinda, and Melvin A. Breuer ITC, page 293-302. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Maximal Diagnosis for Wiring Networks.
Jung-Cheun Lien, and Melvin A. Breuer ITC, page 96-105. IEEE Computer Society, (1991)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Switch-level delay test of domino logic circuits.
Suriyaprakash Natarajan, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 367-376. IEEE Computer Society, (2001)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Crosstalk test generation on pseudo industrial circuits: a case study.
Liang-Chi Chen, T. M. Mak, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 548-557. IEEE Computer Society, (2001)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Multiple tests for each gate delay fault: higher coverage and lower test application cost.
Shahdad Irajpour, Sandeep K. Gupta, and Melvin A. Breuer ITC, page 9. IEEE, (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A novel test methodology based on error-rate to support error-tolerance.
Kuen-Jong Lee, Tong-Yu Hsieh, and Melvin A. Breuer ITC, page 9. IEEE, (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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