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(521)

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On throughput stabilization of network transport.
Nageswara S. V. Rao, Qishi Wu, and S. Sitharama Iyengar IEEE Communications Letters 8(1):66-68 (2004)
to dblp by dblp on Feb 13, 2012, 12:00 AM
URL | BibTeX
Testability considerations in the design of the MC68340 Integrated Processor Unit.
Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, and Wai on Law ITC, page 337-346. IEEE Computer Society, (1990)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
EventGuard: A System Architecture for Securing Publish-Subscribe Networks.
Mudhakar Srivatsa, Ling Liu, and Arun Iyengar ACM Trans. Comput. Syst. 29(4):10 (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Consistent replication in distributed multi-tier architectures.
Thomas Repantis, Arun Iyengar, Vana Kalogeraki, and Isabelle Rouvellou CollaborateCom, page 105-114. IEEE, (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Synthesis of Pseudo-Random Pattern Testable Designs.
Daniel Brand, and Vijay S. Iyengar ITC, page 501-508. IEEE Computer Society, (1989)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Delay Test Generation 2: Algebra and Algorithms.
Vijay S. Iyengar, Barry K. Rosen, and Ilan Y. Spillinger ITC, page 867-876. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Delay Test Generation 1: Concepts and Coverage Metrics.
Vijay S. Iyengar, Barry K. Rosen, and Ilan Y. Spillinger ITC, page 857-866. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Delay Test: The Next Frontier for LSSD Test Systems.
Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, and T. Williams ITC, page 578-587. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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A Small Test Generator for Large Designs.
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vijay S. Iyengar, and Lakshmi N. Reddy ITC, page 30-40. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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AC Test Quality: Beyond Transition Fault Coverage.
Yaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, and Barry K. Rosen ITC, page 568-577. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Test Application Timing: The Unexplored Issue in AC Test.
Vijay S. Iyengar, and Gopalakrishnan Vijayan ITC, page 840-847. IEEE Computer Society, (1991)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Test wrapper and test access mechanism co-optimization for system-on-chip.
Vikram Iyengar, Krishnendu Chakrabarty, and Erik Jan Marinissen ITC, page 1023-1032. IEEE Computer Society, (2001)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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On Optimizing Autonomous Pipeline Inspection.
Xin Li, Wuyi Yu, Xiao Lin, and S. S. Iyengar IEEE Transactions on Robotics 28(1):223-233 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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At-Speed Structural Test For High-Performance ASICs.
Vikram Iyengar, Toshihiko Yokota, Kazuhiro Yamada, Theo Anemikos, Bob Bassett, Mike Degregorio, Rudy Farmer, Gary Grise, Mark Johnson, Dave Milton, Mark Taylor, and Frank Woytowich ITC, page 1-10. IEEE, (2006)
to dblp by dblp on Feb 7, 2012, 12:00 AM
URL | BibTeX
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon.
Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, and Vikram Iyengar ITC, page 1-9. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Low cost at-speed testing using On-Product Clock Generation compatible with test compression.
Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, and Gary Grise ITC, page 724-733. IEEE, (2010)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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On simulating faults in parallel.
Vijay S. Iyengar, and Donald T. Tang FTCS, page 110-115. IEEE Computer Society, (1988)
to dblp by dblp on Feb 4, 2012, 12:00 AM
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Content-Based Prediction of Temporal Boundaries for Events in Twitter.
Akshaya Iyengar, Tim Finin, and Anupam Joshi SocialCom/PASSAT, page 186-191. IEEE, (2011)
to dblp by dblp on Jan 30, 2012, 12:00 AM
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Modeling Unreliable Data and Sensors: Using F-measure Attribute Performance with Test Samples from Low-Cost Sensors.
Vasanth Iyer, and S. Sitharama Iyengar ICDM Workshops, page 15-22. IEEE, (2011)
to dblp by dblp on Jan 28, 2012, 12:00 AM
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Efficient 3D region guarding for multimedia data processing.
Wuyi Yu, Maoqing Li, S. Sitharama Iyengar, and Xin Li ICME, page 1-6. IEEE, (2011)
to dblp by dblp on Jan 27, 2012, 12:00 AM
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