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FPGA technology mapping with encoded libraries and staged priority cuts.
Andrew A. Kennings, Kristofer Vorwerk, Arun Kundu, Val Pevzner, and Andy Fox TRETS 4(4):35 (2011)
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Robust Tests for Parity Trees.
Sandip Kundu, and Sudhakar M. Reddy ITC, page 680-687. IEEE Computer Society, (1988)
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GateMaker: a transistor to gate level model extractor for simulation, automatic test pattern generation and verification.
Sandip Kundu ITC, page 372-381. IEEE Computer Society, (1998)
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Design of Scan-Based Path-Delay-Testable Sequential Circuits.
Ankan K. Pramanick, and Sandip Kundu ITC, page 962-971. IEEE Computer Society, (1993)
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A Small Test Generator for Large Designs.
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vijay S. Iyengar, and Lakshmi N. Reddy ITC, page 30-40. IEEE Computer Society, (1992)
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Identification of crosstalk switch failures in domino CMOS circuits.
Rahul Kundu, and Ronald D. Blanton ITC, page 502-509. IEEE Computer Society, (2000)
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Analyzing and Improving Performance and Energy Efficiency of Android.
Tapas Kumar Kundu, and Kolin Paul J. Low Power Electronics 7(4):516-528 (2011)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Transient fault characterization in dynamic noisy environments.
Ilia Polian, John P. Hayes, Sandip Kundu, and Bernd Becker ITC, page 10. IEEE, (2005)
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On ATPG for multiple aggressor crosstalk faults in presence of gate delays.
Kunal P. Ganeshpure, and Sandip Kundu ITC, page 1-7. IEEE, (2007)
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Self-Checking Comparator with One Periodic Output.
Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, and Steffen Tarnick IEEE Trans. Computers 45(3):379-380 (1996)
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Efficient Leakage-free Authentication of Trees, Graphs and Forests.
Ashish Kundu, Mikhail J. Atallah, and Elisa Bertino IACR Cryptology ePrint Archive (2012)
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Diagnosing scan chain faults.
Sandip Kundu IEEE Trans. VLSI Syst. 2(4):512-516 (1994)
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Statistical Yield Modeling for Sub-wavelength Lithography.
Aswin Sreedhar, and Sandip Kundu ITC, page 1-8. IEEE, (2008)
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An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements.
Kelageri Nagaraj, and Sandip Kundu ITC, page 1-8. IEEE, (2008)
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CONCAT: CONflict Driven Learning in ATPG for Industrial designs.
Surendra Bommu, Kameshwar Chandrasekar, Rahul Kundu, and Sanjay Sengupta ITC, page 1-10. IEEE, (2008)
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On testing prebond dies with incomplete clock networks in a 3D IC using DLLs.
Michael Buttrick, and Sandip Kundu DATE, page 1418-1423. IEEE, (2011)
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Modeling manufacturing process variation for design and test.
Sandip Kundu, and Aswin Sreedhar DATE, page 1147-1152. IEEE, (2011)
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Physically unclonable functions for embeded security based on lithographic variation.
Aswin Sreedhar, and Sandip Kundu DATE, page 1632-1637. IEEE, (2011)
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Shadow checker SC: A low-cost hardware scheme for online detection of faults in small memory structures of a microprocessor.
Rance Rodrigues, Sandip Kundu, and Omer Khan ITC, page 219-228. IEEE, (2010)
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Modeling the impact of process variation on resistive bridge defects.
S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, and Sandip Kundu ITC, page 295-304. IEEE, (2010)
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