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Clique Number vs. Chromatic Number in Wireless Interference Graphs: Simulation Results.
Pradeepkumar Mani, and David W. Petr IEEE Communications Letters 11(7):592-594 (2007)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
Detecting and exploiting near-sortedness for efficient relational query evaluation
Sagi Ben-Moshe, Yaron Kanza, Eldar Fischer, Arie Matsliah, Mani Fischer, and Carl Staelin ICDT, page 256-267. ACM, (2011)
to imported property-testing tolerant-testing by ytyoun and 1 other user on Feb 9, 2012, 4:04 AM
DOI | BibTeX
Minimal overhead modification of iterative logic arrays for C-testability.
Tsu-Wei Ku, and Mani Soma ITC, page 964-969. IEEE Computer Society, (1990)
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A design-for-test methodology for active analog filters.
Mani Soma ITC, page 183-192. IEEE Computer Society, (1990)
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URL | BibTeX
Experimental evaluation of concurrent fault simulation algorithms on scalable, hierarchically defined test cases.
William H. Nicholls, Arnold W. Nordsieck, and Mani Soma ITC, page 698-705. IEEE Computer Society, (1990)
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URL | BibTeX
A BIST Design of Structured Arrays with Fault-Tolerant Layout.
Mehdi Katoozi, and Mani Soma ITC, page 514-521. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Fault Bundling: Reducing Machine Evaluation Activity in Hierarchical Concurrent Fault Simulation.
William H. Nicholls, and Mani Soma ITC, page 569-573. IEEE Computer Society, (1988)
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Optimal Scheduling of Signature Analysis for VLSI Testing.
C. Mani Krishna, and Yann-Hang Lee ITC, page 443-451. IEEE Computer Society, (1988)
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URL | BibTeX
Panel Statement: Increasing test coverage in a VLSI design course.
Mani Soma ITC, page 1136. IEEE Computer Society, (1999)
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URL | BibTeX
Self-checking scheme for very fast clocks' skew correction.
Cecilia Metra, Flavio Giovanelli, Mani Soma, and Bruno Riccò ITC, page 652-661. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Analog and Mixed-Signal Benchmark Circuits-First Release.
Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, and Prashant Goteti ITC, page 183-190. IEEE Computer Society, (1997)
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Experimental Results for Current-Based Analog Scan.
Thomas M. Bocek, Tuyen D. Vu, Mani Soma, and Jason D. Moffatt ITC, page 768-775. IEEE Computer Society, (1997)
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Screening for Known Good Die KGD Based on Defect Clustering: An Experimental Study.
Adit D. Singh, Phil Nigh, and C. Mani Krishna ITC, page 362-369. IEEE Computer Society, (1997)
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URL | BibTeX
Dynamic Testing of ADCs Using Wavelet Transforms.
Takahiro J. Yamaguchi, and Mani Soma ITC, page 379-388. IEEE Computer Society, (1997)
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Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs.
Giri Devarayanadurg, Prashant Goteti, and Mani Soma ITC, page 521-527. IEEE Computer Society, (1996)
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Fault Coverage of DC Parametric Tests for Embedded Analog Amplifiers.
Mani Soma ITC, page 566-573. IEEE Computer Society, (1993)
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Fault Diagnosis of Flash ADC using DNL Test.
Anchada Charoenrook, and Mani Soma ITC, page 680-689. IEEE Computer Society, (1993)
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On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction.
Adit D. Singh, and C. Mani Krishna ITC, page 228-237. IEEE Computer Society, (1991)
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URL | BibTeX
Jitter measurements of a PowerPCTM microprocessor using an analytic signal method.
Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, and Toshifumi Watanabe ITC, page 955-964. IEEE Computer Society, (2000)
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Test evaluation and data on defect-oriented BIST architecture for high-speed PLL.
Seongwon Kim, and Mani Soma ITC, page 830-837. IEEE Computer Society, (2001)
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