%0 Journal Article %1 journals/tvlsi/Laflamme-MayerK19 %A Laflamme-Mayer, Nicolas %A Kowarzyk, Gilbert %A Blaquière, Yves %A Savaria, Yvon %A Sawan, Mohamad %D 2019 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 2 %P 304-315 %T A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#Laflamme-MayerK19 %V 27

@article{journals/tvlsi/Laflamme-MayerK19, added-at = {2020-03-11T00:00:00.000+0100}, author = {Laflamme-Mayer, Nicolas and Kowarzyk, Gilbert and Blaquière, Yves and Savaria, Yvon and Sawan, Mohamad}, biburl = {https://www.bibsonomy.org/bibtex/28cd4ffa80c4b5bfe6147ef010fc3f12b/dblp}, ee = {https://doi.org/10.1109/TVLSI.2018.2876458}, interhash = {00d1e15d0e6e2fd215ab8866aa30ae10}, intrahash = {8cd4ffa80c4b5bfe6147ef010fc3f12b}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 2, pages = {304-315}, timestamp = {2020-03-12T11:45:34.000+0100}, title = {A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#Laflamme-MayerK19}, volume = 27, year = 2019 }