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%0 Journal Article
%1 journals/mr/BiesemansSVDCD04
%A Biesemans, Leen
%A Schepers, K.
%A Vanstreels, Kris
%A D'Haen, Jan
%A Ceuninck, Ward De
%A D'Olieslaeger, Marc
%D 2004
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1849-1854
%T MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.
%U http://dblp.uni-trier.de/db/journals/mr/mr44.html#BiesemansSVDCD04
%V 44
@article{journals/mr/BiesemansSVDCD04,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Biesemans, Leen and Schepers, K. and Vanstreels, Kris and D'Haen, Jan and Ceuninck, Ward De and D'Olieslaeger, Marc},
biburl = {https://www.bibsonomy.org/bibtex/277d7c7d195e83d777d6399c55db3427d/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.07.096},
interhash = {055d1266e4cf60a40d6780906d94ba4c},
intrahash = {77d7c7d195e83d777d6399c55db3427d},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1849-1854},
timestamp = {2024-04-09T02:50:13.000+0200},
title = {MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#BiesemansSVDCD04},
volume = 44,
year = 2004
}