%0 Journal Article %1 journals/mr/BiesemansSVDCD04 %A Biesemans, Leen %A Schepers, K. %A Vanstreels, Kris %A D'Haen, Jan %A Ceuninck, Ward De %A D'Olieslaeger, Marc %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1849-1854 %T MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#BiesemansSVDCD04 %V 44

@article{journals/mr/BiesemansSVDCD04, added-at = {2023-09-30T00:00:00.000+0200}, author = {Biesemans, Leen and Schepers, K. and Vanstreels, Kris and D'Haen, Jan and Ceuninck, Ward De and D'Olieslaeger, Marc}, biburl = {https://www.bibsonomy.org/bibtex/277d7c7d195e83d777d6399c55db3427d/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.096}, interhash = {055d1266e4cf60a40d6780906d94ba4c}, intrahash = {77d7c7d195e83d777d6399c55db3427d}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1849-1854}, timestamp = {2024-04-09T02:50:13.000+0200}, title = {MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#BiesemansSVDCD04}, volume = 44, year = 2004 }