%0 Journal Article %1 journals/tcad/Al-YamaniDCGG07 %A Al-Yamani, Ahmad A. %A Devta-Prasanna, Narendra %A Chmelar, Erik %A Grinchuk, M. %A Gunda, Arun %D 2007 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 5 %P 907-918 %T Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. %U http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#Al-YamaniDCGG07 %V 26

@article{journals/tcad/Al-YamaniDCGG07, added-at = {2020-09-24T00:00:00.000+0200}, author = {Al-Yamani, Ahmad A. and Devta-Prasanna, Narendra and Chmelar, Erik and Grinchuk, M. and Gunda, Arun}, biburl = {https://www.bibsonomy.org/bibtex/2ea946a6e1f6623847075ab94c3807c58/dblp}, ee = {https://doi.org/10.1109/TCAD.2006.884582}, interhash = {0998c3563ea9331e0063c23c6feda1d6}, intrahash = {ea946a6e1f6623847075ab94c3807c58}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 5, pages = {907-918}, timestamp = {2020-09-25T11:47:02.000+0200}, title = {Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#Al-YamaniDCGG07}, volume = 26, year = 2007 }