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Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.

, , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (5): 907-918 (2007)

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Subframe multiplexing for FPGA manufacturing test configuration.. FPGA, page 245. ACM, (2004)Inconsistent Fail due to Limited Tester Timing Accuracy., , , and . VTS, page 47-52. IEEE Computer Society, (2008)Segmented Addressable Scan Architecture., , and . VTS, page 405-411. IEEE Computer Society, (2005)FPGA Interconnect Delay Fault Testing.. ITC, page 1239-1247. IEEE Computer Society, (2003)Minimizing the number of test configurations for FPGAs.. ICCAD, page 899-902. IEEE Computer Society / ACM, (2004)Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (5): 907-918 (2007)Session Abstract., and . VTS, page 156-157. IEEE Computer Society, (2006)FPGA Bridging Fault Detection and Location via Differential IDDQ., and . VTS, page 109-116. IEEE Computer Society, (2004)