%0 Journal Article %1 journals/tcad/ChakradharRA97 %A Chakradhar, Srimat T. %A Rothweiler, Steven G. %A Agrawal, Vishwani D. %D 1997 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 1370-1377 %T Redundancy removal and test generation for circuits with non-Boolean primitives. %U http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#ChakradharRA97 %V 16

@article{journals/tcad/ChakradharRA97, added-at = {2020-09-24T00:00:00.000+0200}, author = {Chakradhar, Srimat T. and Rothweiler, Steven G. and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2ff02da746c44854e33a41a5bfabcc98b/dblp}, ee = {https://doi.org/10.1109/43.663826}, interhash = {099d5b0308c74139a263e013555e72c4}, intrahash = {ff02da746c44854e33a41a5bfabcc98b}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {1370-1377}, timestamp = {2020-09-25T11:47:02.000+0200}, title = {Redundancy removal and test generation for circuits with non-Boolean primitives.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#ChakradharRA97}, volume = 16, year = 1997 }