%0 Journal Article %1 journals/tim/OttaviSWKML06 %A Ottavi, Marco %A Schiano, Luca %A Wang, Xiaopeng %A Kim, Yong-Bin %A Meyer, Fred J. %A Lombardi, Fabrizio %D 2006 %J IEEE Trans. Instrumentation and Measurement %K %N 5 %P 1704-1712 %T Evaluating the Yield of Repairable SRAMs for ATE. %U http://dblp.uni-trier.de/db/journals/tim/tim55.html#OttaviSWKML06 %V 55

@article{journals/tim/OttaviSWKML06, added-at = {2023-12-12T18:14:23.000+0100}, author = {Ottavi, Marco and Schiano, Luca and Wang, Xiaopeng and Kim, Yong-Bin and Meyer, Fred J. and Lombardi, Fabrizio}, biburl = {https://www.bibsonomy.org/bibtex/2c9c7eec6016d81e7c95ce8e5b354ec20/admin}, ee = {http://dx.doi.org/10.1109/TIM.2006.880315}, interhash = {0f6edc4cfe1f337390a624a01465fbeb}, intrahash = {c9c7eec6016d81e7c95ce8e5b354ec20}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {}, number = 5, pages = {1704-1712}, timestamp = {2023-12-12T18:14:23.000+0100}, title = {Evaluating the Yield of Repairable SRAMs for ATE.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim55.html#OttaviSWKML06}, volume = 55, year = 2006 }