%0 Conference Paper %1 conf/dft/WangPBEV18 %A Wang, Naixing %A Pomeranz, Irith %A Benware, Brady %A Amyeen, M. Enamul %A Venkataraman, Srikanth %B DFT %D 2018 %I IEEE Computer Society %K dblp %P 1-6 %T Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. %U http://dblp.uni-trier.de/db/conf/dft/dft2018.html#WangPBEV18 %@ 978-1-5386-8398-9

@inproceedings{conf/dft/WangPBEV18, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wang, Naixing and Pomeranz, Irith and Benware, Brady and Amyeen, M. Enamul and Venkataraman, Srikanth}, biburl = {https://www.bibsonomy.org/bibtex/2517fb3726d35ce885d55e7f602cf7fb3/dblp}, booktitle = {DFT}, crossref = {conf/dft/2018}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2018.8602935}, interhash = {0f99531d3284f0fa971cdd4f0a340f25}, intrahash = {517fb3726d35ce885d55e7f602cf7fb3}, isbn = {978-1-5386-8398-9}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:23.000+0200}, title = {Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2018.html#WangPBEV18}, year = 2018 }