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Другие публикации лиц с тем же именем

Diagnosis meets Physical Failure Analysis: What is needed to succeed?. ITC, стр. 1442. IEEE Computer Society, (2004)Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure., , , и . ITC, стр. 1-9. IEEE, (2017)Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults., , и . VTS, стр. 1-6. IEEE, (2019)Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction., , , и . IEEE Trans. Very Large Scale Integr. Syst., 25 (4): 1497-1505 (2017)Diagnostic simulation of stuck-at faults in combinational circuits., , и . J. Electron. Test., 8 (1): 87-97 (1996)Simulation- and Deduction-Based Techniques for Fault Diagnosis. University of Illinois Urbana-Champaign, USA, (1997)Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection., , и . ITC, стр. 489-497. IEEE Computer Society, (2004)Diagnostic Simulation of Sequential Circuits Using Fault Sampling., , и . VLSI Design, стр. 476-481. IEEE Computer Society, (1998)Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs., , , и . DATE, стр. 996-1001. IEEE Computer Society, (2005)Fault Diagnosis and Fault Model Aliasing., , и . ISVLSI, стр. 206-211. IEEE Computer Society, (2005)