%0 Conference Paper %1 conf/ddecs/DubeyGB07 %A Dubey, Prashant %A Garg, Akhil %A Bhaskarani, Sravan Kumar %B DDECS %D 2007 %E Girard, Patrick %E Krasniewski, Andrzej %E Gramatová, Elena %E Pawlak, Adam %E Garbolino, Tomasz %I IEEE Computer Society %K dblp %P 167-172 %T Built in Defect Prognosis for Embedded Memories. %U http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#DubeyGB07 %@ 1-4244-1161-0

@inproceedings{conf/ddecs/DubeyGB07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Dubey, Prashant and Garg, Akhil and Bhaskarani, Sravan Kumar}, biburl = {https://www.bibsonomy.org/bibtex/2fa00695217d63f90d4a0999cce82523e/dblp}, booktitle = {DDECS}, crossref = {conf/ddecs/2007}, editor = {Girard, Patrick and Krasniewski, Andrzej and Gramatová, Elena and Pawlak, Adam and Garbolino, Tomasz}, ee = {https://doi.ieeecomputersociety.org/10.1109/DDECS.2007.4295275}, interhash = {0311a7140d540392313d18e64724d53c}, intrahash = {fa00695217d63f90d4a0999cce82523e}, isbn = {1-4244-1161-0}, keywords = {dblp}, pages = {167-172}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:40:49.000+0200}, title = {Built in Defect Prognosis for Embedded Memories.}, url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2007.html#DubeyGB07}, year = 2007 }