Inproceedings,
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.
E. Lee, L. Hurtado, J. Joh, S. Krishnan, S. Pendharkar, and J. del Alamo.IRPS, page 1-5. IEEE, (2019)
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- conf/irps/LeeHJKPA19
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- inproceedings
- booktitle
- IRPS
- year
- 2019
- pages
- 1-5
- publisher
- IEEE
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- conf/irps/2019
- ee
- https://doi.org/10.1109/IRPS.2019.8720550
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- 978-1-5386-9504-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2019.html#LeeHJKPA19
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- please select -%0 Conference Paper
%1 conf/irps/LeeHJKPA19
%A Lee, Ethan S.
%A Hurtado, Luis
%A Joh, Jungwoo
%A Krishnan, Srikanth
%A Pendharkar, Sameer
%A del Alamo, Jesús A.
%B IRPS
%D 2019
%I IEEE
%K dblp
%P 1-5
%T Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.
%U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#LeeHJKPA19
%@ 978-1-5386-9504-3
@inproceedings{conf/irps/LeeHJKPA19,
added-at = {2019-06-02T00:00:00.000+0200},
author = {Lee, Ethan S. and Hurtado, Luis and Joh, Jungwoo and Krishnan, Srikanth and Pendharkar, Sameer and del Alamo, Jesús A.},
biburl = {https://www.bibsonomy.org/bibtex/2340f0544f4d9cca7c0e16b95582fe293/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2019},
ee = {https://doi.org/10.1109/IRPS.2019.8720550},
interhash = {08627244d2b7686639a709baf255c29b},
intrahash = {340f0544f4d9cca7c0e16b95582fe293},
isbn = {978-1-5386-9504-3},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2019-10-17T14:45:22.000+0200},
title = {Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#LeeHJKPA19},
year = 2019
}