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Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.

E. Lee, L. Hurtado, J. Joh, S. Krishnan, S. Pendharkar, and J. del Alamo. IRPS, page 1-5. IEEE, (2019)

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Bijan Alamouti

Darius Alamouti

Pedro Miguel d' Jesús Montilva

Ahmed Alamouri

Cyrus Alamouti

Other publications of authors with the same name

Positive-bias temperature instability (PBTI) of GaN MOSFETs.A. Guo, and J. del Alamo. IRPS, page 6. IEEE, (2015)A Versatile Internet-Accessible Electronics Workbench with Troubleshooting Capabilities.H. Soumare, R. Shroff, J. Hardison, J. del Alamo, V. Harward, P. Bailey, and K. DeLong. Int. J. Online Eng., 5 (S1): 72-80 (2009)Breakdown in millimeter-wave power InP HEMTs: a comparison with GaAs PHEMT's.J. del Alamo, and M. Somerville. IEEE J. Solid State Circuits, 34 (9): 1204-1211 (1999)Nanometer-scale InGaAs Field-Effect Transistors for THz and CMOS technologies.J. del Alamo. ESSCIRC, page 16-21. IEEE, (2013)Nanoscale InGaAs FinFETs: Band-to-Band Tunneling and Ballistic Transport.J. del Alamo, X. Cai, X. Zhao, A. Vardi, and J. Grajal. ESSDERC, page 203-206. IEEE, (2021)Activation energy of drain-current degradation in GaN HEMTs under high-power DC stress.Y. Wu, C. Chen, and J. del Alamo. Microelectron. Reliab., 54 (12): 2668-2674 (2014)Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.E. Lee, L. Hurtado, J. Joh, S. Krishnan, S. Pendharkar, and J. del Alamo. IRPS, page 1-5. IEEE, (2019)Issues Faced in a Remote Instrumentation Laboratory.S. Malani, G. Prasanna, J. del Alamo, J. Hardison, K. Moudgalya, and V. Chopella. T4E, page 67-74. IEEE Computer Society, (2012)Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions.T. Hisaka, H. Sasaki, Y. Nogami, K. Hosogi, N. Yoshida, A. Villanueva, J. del Alamo, S. Hasegawa, and H. Asahi. Microelectron. Reliab., 49 (12): 1515-1519 (2009)Impact of Gate Offset on PBTI of p-GaN Gate HEMTs.E. Lee, J. Joh, D. Lee, and J. del Alamo. IRPS, page 21-1. IEEE, (2022)

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Disambiguation of "del Alamo, Jesús A."

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Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.

Please choose a person to relate this publication to

Bijan Alamouti

Darius Alamouti

Pedro Miguel d' Jesús Montilva

Ahmed Alamouri

Cyrus Alamouti

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "del Alamo, Jesús A."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.

Please choose a person to relate this publication to

Bijan Alamouti

Darius Alamouti

Pedro Miguel d' Jesús Montilva

Ahmed Alamouri

Cyrus Alamouti

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.