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%0 Conference Paper
%1 conf/iccad/ZhangSSCA13
%A Zhang, Yan
%A Sankaranarayanan, Sriram
%A Somenzi, Fabio
%A Chen, Xin
%A Ábrahám, Erika
%B ICCAD
%D 2013
%E Henkel, Jörg
%I IEEE
%K dblp
%P 662-669
%T From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits.
%U http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#ZhangSSCA13
%@ 978-1-4799-1069-4
@inproceedings{conf/iccad/ZhangSSCA13,
added-at = {2019-09-06T00:00:00.000+0200},
author = {Zhang, Yan and Sankaranarayanan, Sriram and Somenzi, Fabio and Chen, Xin and Ábrahám, Erika},
biburl = {https://www.bibsonomy.org/bibtex/29041f24e7d926770f0f6849a01f394f9/dblp},
booktitle = {ICCAD},
crossref = {conf/iccad/2013},
editor = {Henkel, Jörg},
ee = {http://dl.acm.org/citation.cfm?id=2561958},
interhash = {15aadcf5795e1a8c8f4d80e055e4773b},
intrahash = {9041f24e7d926770f0f6849a01f394f9},
isbn = {978-1-4799-1069-4},
keywords = {dblp},
pages = {662-669},
publisher = {IEEE},
timestamp = {2019-10-17T22:45:18.000+0200},
title = {From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits.},
url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#ZhangSSCA13},
year = 2013
}