%0 Conference Paper %1 conf/iccad/ZhangSSCA13 %A Zhang, Yan %A Sankaranarayanan, Sriram %A Somenzi, Fabio %A Chen, Xin %A Ábrahám, Erika %B ICCAD %D 2013 %E Henkel, Jörg %I IEEE %K dblp %P 662-669 %T From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#ZhangSSCA13 %@ 978-1-4799-1069-4

@inproceedings{conf/iccad/ZhangSSCA13, added-at = {2019-09-06T00:00:00.000+0200}, author = {Zhang, Yan and Sankaranarayanan, Sriram and Somenzi, Fabio and Chen, Xin and Ábrahám, Erika}, biburl = {https://www.bibsonomy.org/bibtex/29041f24e7d926770f0f6849a01f394f9/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2013}, editor = {Henkel, Jörg}, ee = {http://dl.acm.org/citation.cfm?id=2561958}, interhash = {15aadcf5795e1a8c8f4d80e055e4773b}, intrahash = {9041f24e7d926770f0f6849a01f394f9}, isbn = {978-1-4799-1069-4}, keywords = {dblp}, pages = {662-669}, publisher = {IEEE}, timestamp = {2019-10-17T22:45:18.000+0200}, title = {From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2013.html#ZhangSSCA13}, year = 2013 }