%0 Conference Paper %1 conf/ewdts/AlouaniNHR15 %A Alouani, Ihsen %A Niar, Smaïl %A Hillali, Yassin El %A Rivenq-Menhaj, Atika %B EWDTS %D 2015 %I IEEE Computer Society %K %P 1-4 %T Modeling transistor level masking of soft errors in combinational circuits. %U http://dblp.uni-trier.de/db/conf/ewdts/ewdts2015.html#AlouaniNHR15 %@ 978-1-4673-7776-8

@inproceedings{conf/ewdts/AlouaniNHR15, added-at = {2023-12-12T18:54:05.000+0100}, author = {Alouani, Ihsen and Niar, Smaïl and Hillali, Yassin El and Rivenq-Menhaj, Atika}, biburl = {https://www.bibsonomy.org/bibtex/23efcded1b73a607b82428d123fb3a7ea/admin}, booktitle = {EWDTS}, crossref = {conf/ewdts/2015}, ee = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2015.7493140}, interhash = {18d8da521a6271cd4abaf61f2a38c1c5}, intrahash = {3efcded1b73a607b82428d123fb3a7ea}, isbn = {978-1-4673-7776-8}, keywords = {}, pages = {1-4}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T18:54:05.000+0100}, title = {Modeling transistor level masking of soft errors in combinational circuits.}, url = {http://dblp.uni-trier.de/db/conf/ewdts/ewdts2015.html#AlouaniNHR15}, year = 2015 }