%0 Conference Paper %1 conf/vlsi-dat/ChenWBA13 %A Chen, Wen %A Wang, Li-C. %A Bhadra, Jayanta %A Abadir, Magdy S. %B VLSI-DAT %D 2013 %I IEEE %K dblp %P 1-4 %T Novel test analysis to improve structural coverage - A commercial experiment. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#ChenWBA13 %@ 978-1-4673-4435-7

@inproceedings{conf/vlsi-dat/ChenWBA13, added-at = {2015-09-28T00:00:00.000+0200}, author = {Chen, Wen and Wang, Li-C. and Bhadra, Jayanta and Abadir, Magdy S.}, biburl = {https://www.bibsonomy.org/bibtex/2f3d622917540bff1eb1fb96f3498441b/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2013}, ee = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533851}, interhash = {24e08ff613f5daac3b2a6124929aa9ff}, intrahash = {f3d622917540bff1eb1fb96f3498441b}, isbn = {978-1-4673-4435-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:18.000+0200}, title = {Novel test analysis to improve structural coverage - A commercial experiment.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#ChenWBA13}, year = 2013 }