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Novel test analysis to improve structural coverage - A commercial experiment.

, , , and . VLSI-DAT, page 1-4. IEEE, (2013)

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On application of data mining in functional debug., , , and . ICCAD, page 670-675. IEEE, (2014)Modeling and verification of industrial flash memories., , , and . ISQED, page 705-712. IEEE, (2010)Striking a balance between SoC security and debug requirements., and . SoCC, page 368-373. IEEE, (2016)Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation., , and . IEEE Des. Test Comput., 21 (6): 494-502 (2004)A kernel-based approach for functional test program generation., , and . ITC, page 164-173. IEEE Computer Society, (2010)Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study., , , and . MTV, page 33-36. IEEE Computer Society, (2006)Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery., , , and . DAC, page 34:1-34:6. ACM, (2017)An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology., , , , and . ASP-DAC, page 163-168. IEEE, (2012)A Formal Framework for Verification of Embedded Custom Memories of the Motorola MPC7450 Microprocessor., , and . Formal Methods Syst. Des., 27 (1-2): 67-112 (2005)Challenges and Trends in Modern SoC Design Verification., , , , and . IEEE Des. Test, 34 (5): 7-22 (2017)