%0 Journal Article %1 journals/tcad/HuangAT98 %A Huang, Kaiyuan %A Agarwal, Vinod K. %A Thulasiraman, Krishnaiyan %D 1998 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 2 %P 136-148 %T Diagnosis of clustered faults and wafer testing. %U http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#HuangAT98 %V 17

@article{journals/tcad/HuangAT98, added-at = {2020-09-24T00:00:00.000+0200}, author = {Huang, Kaiyuan and Agarwal, Vinod K. and Thulasiraman, Krishnaiyan}, biburl = {https://www.bibsonomy.org/bibtex/247f004c05f78d144b9c259b73847821d/dblp}, ee = {https://doi.org/10.1109/43.681263}, interhash = {26fc7539b6e696d4653be499bf8fffdc}, intrahash = {47f004c05f78d144b9c259b73847821d}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 2, pages = {136-148}, timestamp = {2020-09-25T11:45:16.000+0200}, title = {Diagnosis of clustered faults and wafer testing.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#HuangAT98}, volume = 17, year = 1998 }