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Disambiguation of "Agarwal, Vinod K."

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Diagnosis of clustered faults and wafer testing.

, , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (2): 136-148 (1998)

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Vinod Prakash Agarwal

S Vinodh

Vinod Jadhav

Vinod Vaikuntanathan

Vinod Talgeri

 

Other publications of authors with the same name

Higher Certainty of Error Coverage by Output Data Modification., and . ITC, page 140-147. IEEE Computer Society, (1984)Testability Measures : What Do They Do for ATPG ?, and . ITC, page 129-139. IEEE Computer Society, (1986)Resolution-Oriented Fault Interrelationships in Combinational Logic Networks., and . IEEE Trans. Computers, 26 (11): 1170-1175 (1977)Recursive Coverage Projection of Test Sets., and . IEEE Trans. Computers, 28 (11): 865-870 (1979)Testing and Diagnosis of Interconnects Using Boundary Scan Architecture., , and . ITC, page 126-137. IEEE Computer Society, (1988)VTS 1994 Panel Report on BIST for Consumer Products.. IEEE Des. Test Comput., 12 (1): 12- (1995)Performance of Interconnection Network in Multithreaded Architectures., , , and . PARLE, volume 817 of Lecture Notes in Computer Science, page 823-826. Springer, (1994)Invited Talk: Embedded Test for Systems-on-a-Chip.. VLSI Design, IEEE Computer Society, (1999)Optimizing error masking in BIST by output data modification., and . J. Electron. Test., 1 (1): 59-71 (1990)Testing and Applications of Inverter-Free PLAs., and . IEEE Des. Test, 4 (6): 30-40 (1987)