%0 Journal Article %1 journals/tcas/NhoYWJ08 %A Nho, Hyunwoo %A Yoon, Sei-Seung %A Wong, S. Simon %A Jung, Seong-Ook %D 2008 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 9 %P 907-911 %T Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo Simulation. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII55.html#NhoYWJ08 %V 55-II

@article{journals/tcas/NhoYWJ08, added-at = {2020-05-27T00:00:00.000+0200}, author = {Nho, Hyunwoo and Yoon, Sei-Seung and Wong, S. Simon and Jung, Seong-Ook}, biburl = {https://www.bibsonomy.org/bibtex/27b57efb563078105082efbd3ada817ee/dblp}, ee = {https://doi.org/10.1109/TCSII.2008.923411}, interhash = {2914ee2018eae9f6e2723997a9289c90}, intrahash = {7b57efb563078105082efbd3ada817ee}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, number = 9, pages = {907-911}, timestamp = {2020-05-28T11:54:13.000+0200}, title = {Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo Simulation.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII55.html#NhoYWJ08}, volume = {55-II}, year = 2008 }