%0 Journal Article %1 journals/tc/SrinivasanGB00 %A Srinivasan, Rajagopalan %A Gupta, Sandeep K. %A Breuer, Melvin A. %D 2000 %J IEEE Trans. Computers %K dblp %N 11 %P 1228-1240 %T Novel Test Pattern Generators for Pseudoexhaustive Testing. %U http://dblp.uni-trier.de/db/journals/tc/tc49.html#SrinivasanGB00 %V 49

@article{journals/tc/SrinivasanGB00, added-at = {2023-09-21T00:00:00.000+0200}, author = {Srinivasan, Rajagopalan and Gupta, Sandeep K. and Breuer, Melvin A.}, biburl = {https://www.bibsonomy.org/bibtex/2c9293602620308ec2b82580190942c60/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/12.895939}, interhash = {2961487e7e67739a96c115c546ee286f}, intrahash = {c9293602620308ec2b82580190942c60}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 11, pages = {1228-1240}, timestamp = {2024-04-08T18:30:34.000+0200}, title = {Novel Test Pattern Generators for Pseudoexhaustive Testing.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc49.html#SrinivasanGB00}, volume = 49, year = 2000 }