%0 Conference Paper %1 conf/ats/SrinivasAB95 %A Srinivas, Mandyam-Komar %A Agrawal, Vishwani D. %A Bushnell, Michael L. %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 339-345 %T Functional test generation for path delay faults. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#SrinivasAB95 %@ 0-8186-7129-7

@inproceedings{conf/ats/SrinivasAB95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Srinivas, Mandyam-Komar and Agrawal, Vishwani D. and Bushnell, Michael L.}, biburl = {https://www.bibsonomy.org/bibtex/219745e821cac0331631350e8f5d25545/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485358}, interhash = {29bf8a181980eaa1d8ec70dc3ebb646f}, intrahash = {19745e821cac0331631350e8f5d25545}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {339-345}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {Functional test generation for path delay faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#SrinivasAB95}, year = 1995 }