%0 Conference Paper %1 conf/ats/LechnerRH01 %A Lechner, Andreas %A Richardson, Andrew %A Hermes, B. %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 417-422 %T Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft? %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#LechnerRH01 %@ 0-7695-1378-6

@inproceedings{conf/ats/LechnerRH01, added-at = {2023-07-25T00:00:00.000+0200}, author = {Lechner, Andreas and Richardson, Andrew and Hermes, B.}, biburl = {https://www.bibsonomy.org/bibtex/2123b1e854dc65eb5ed031d8b3cdef9f6/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990319}, interhash = {2a164a4b3acc5ddefa5b7c7f97c8a539}, intrahash = {123b1e854dc65eb5ed031d8b3cdef9f6}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {417-422}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft?}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#LechnerRH01}, year = 2001 }