%0 Conference Paper %1 conf/itc/WatanabeMHASOO13 %A Watanabe, Daisuke %A Masuda, Shin %A Hara, Hideo %A Ataka, Tsuyoshi %A Seki, Atsushi %A Ono, Atsushi %A Okayasu, Toshiyuki %B ITC %D 2013 %I IEEE Computer Society %K dblp %P 1-10 %T 30-Gb/s optical and electrical test solution for high-volume testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2013.html#WatanabeMHASOO13 %@ 978-1-4799-0859-2

@inproceedings{conf/itc/WatanabeMHASOO13, added-at = {2023-03-23T00:00:00.000+0100}, author = {Watanabe, Daisuke and Masuda, Shin and Hara, Hideo and Ataka, Tsuyoshi and Seki, Atsushi and Ono, Atsushi and Okayasu, Toshiyuki}, biburl = {https://www.bibsonomy.org/bibtex/26d98e7338a4578e496b74be56af7c7c5/dblp}, booktitle = {ITC}, crossref = {conf/itc/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651887}, interhash = {2f021e4b36d7970829385d8599444743}, intrahash = {6d98e7338a4578e496b74be56af7c7c5}, isbn = {978-1-4799-0859-2}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:44.000+0200}, title = {30-Gb/s optical and electrical test solution for high-volume testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2013.html#WatanabeMHASOO13}, year = 2013 }