%0 Journal Article %1 journals/mr/FelixSFSG04 %A Felix, J. A. %A Schwank, J. R. %A Fleetwood, Daniel M. %A Shaneyfelt, M. R. %A Gusev, Evgeni P. %D 2004 %J Microelectron. Reliab. %K dblp %N 4 %P 563-575 %T Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#FelixSFSG04 %V 44

@article{journals/mr/FelixSFSG04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Felix, J. A. and Schwank, J. R. and Fleetwood, Daniel M. and Shaneyfelt, M. R. and Gusev, Evgeni P.}, biburl = {https://www.bibsonomy.org/bibtex/2c6ef4af8d455f8876d68c730012dc3e6/dblp}, ee = {https://doi.org/10.1016/j.microrel.2003.12.005}, interhash = {2f925e33840ef5d7cdbb4325a029bc39}, intrahash = {c6ef4af8d455f8876d68c730012dc3e6}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 4, pages = {563-575}, timestamp = {2020-02-25T13:25:30.000+0100}, title = {Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#FelixSFSG04}, volume = 44, year = 2004 }