%0 Journal Article %1 journals/mr/AlamKVM07 %A Alam, Muhammad Ashraful %A Kufluoglu, Haldun %A Varghese, Dhanoop %A Mahapatra, S. %D 2007 %J Microelectron. Reliab. %K dblp %N 6 %P 853-862 %T A comprehensive model for PMOS NBTI degradation: Recent progress. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#AlamKVM07 %V 47

@article{journals/mr/AlamKVM07, added-at = {2022-05-09T00:00:00.000+0200}, author = {Alam, Muhammad Ashraful and Kufluoglu, Haldun and Varghese, Dhanoop and Mahapatra, S.}, biburl = {https://www.bibsonomy.org/bibtex/2049061833916e8485f57324137d04abe/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.10.012}, interhash = {307b6a8f3056484c2bf5ba8ac319e9f7}, intrahash = {049061833916e8485f57324137d04abe}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {853-862}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {A comprehensive model for PMOS NBTI degradation: Recent progress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#AlamKVM07}, volume = 47, year = 2007 }