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%0 Journal Article
%1 journals/mr/EsselyDPRBGBPTL06
%A Essely, Fabien
%A Darracq, Frédéric
%A Pouget, Vincent
%A Remmach, Mustapha
%A Beaudoin, Felix
%A Guitard, Nicolas
%A Bafleur, Marise
%A Perdu, Philippe
%A Touboul, André
%A Lewis, Dean
%D 2006
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1563-1568
%T Application of various optical techniques for ESD defect localization.
%U http://dblp.uni-trier.de/db/journals/mr/mr46.html#EsselyDPRBGBPTL06
%V 46
@article{journals/mr/EsselyDPRBGBPTL06,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Essely, Fabien and Darracq, Frédéric and Pouget, Vincent and Remmach, Mustapha and Beaudoin, Felix and Guitard, Nicolas and Bafleur, Marise and Perdu, Philippe and Touboul, André and Lewis, Dean},
biburl = {https://www.bibsonomy.org/bibtex/2b895d4b3ff63a34d7499010994544fd9/dblp},
ee = {https://doi.org/10.1016/j.microrel.2006.07.021},
interhash = {386eede72fe29a3ac888280dbf91204a},
intrahash = {b895d4b3ff63a34d7499010994544fd9},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1563-1568},
timestamp = {2020-02-25T13:30:16.000+0100},
title = {Application of various optical techniques for ESD defect localization.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#EsselyDPRBGBPTL06},
volume = 46,
year = 2006
}