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Identification of process/design issues during 0.18 µm technology qualification for space application., , , and . DATE, page 989-993. EDA Consortium, San Jose, CA, USA, (2007)Frequency mapping in dynamic light emission with wavelet transform., , , , and . Microelectron. Reliab., 53 (9-11): 1387-1392 (2013)Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems., , , , , , and . Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1781-1786 (2004)Application of various optical techniques for ESD defect localization., , , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1563-1568 (2006)Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory., , , , and . FUSION, page 1-8. IEEE, (2017)Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization., , , , and . Microelectron. Reliab., 51 (9-11): 1684-1688 (2011)Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization., , , , and . Microelectron. Reliab., 55 (9-10): 1622-1627 (2015)Solar Cell Analysis with Light Emission and OBIC Techniques., , , , , and . Microelectron. Reliab., 43 (9-11): 1755-1760 (2003)Oxide charge measurements in EEPROM devices., , , , and . Microelectron. Reliab., 45 (9-11): 1514-1519 (2005)