%0 Conference Paper %1 conf/irps/JiGLLLUPHSLSLSH19 %A Ji, Y. %A Goo, H. J. %A Lim, J. %A Lee, S. B. %A Lee, S. %A Uemura, Taiki %A Park, J. C. %A Han, S. I. %A Shin, S. C. %A Lee, J. H. %A Song, Y. J. %A Lee, K. M. %A Shin, H. M. %A Hwang, S. H. %A Seo, B. Y. %A Lee, Y. K. %A Kim, J. C. %A Koh, Gwanhyeob %A Park, K. C. %A Pae, Sangwoo %A Jeong, Gi-Tae %A Yoon, J. S. %A Jung, E. S. %B IRPS %D 2019 %I IEEE %K dblp %P 1-3 %T Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#JiGLLLUPHSLSLSH19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/JiGLLLUPHSLSLSH19, added-at = {2022-04-20T00:00:00.000+0200}, author = {Ji, Y. and Goo, H. J. and Lim, J. and Lee, S. B. and Lee, S. and Uemura, Taiki and Park, J. C. and Han, S. I. and Shin, S. C. and Lee, J. H. and Song, Y. J. and Lee, K. M. and Shin, H. M. and Hwang, S. H. and Seo, B. Y. and Lee, Y. K. and Kim, J. C. and Koh, Gwanhyeob and Park, K. C. and Pae, Sangwoo and Jeong, Gi-Tae and Yoon, J. S. and Jung, E. S.}, biburl = {https://www.bibsonomy.org/bibtex/26f28f75d0f7215f781bcaab7c0039d2a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720429}, interhash = {3ea1e07fdc7ad8ebd1084a9283938fce}, intrahash = {6f28f75d0f7215f781bcaab7c0039d2a}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-3}, publisher = {IEEE}, timestamp = {2024-04-10T16:55:06.000+0200}, title = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#JiGLLLUPHSLSLSH19}, year = 2019 }