%0 Conference Paper %1 conf/ats/ShinogiYHTY05 %A Shinogi, Tsuyoshi %A Yamada, Hiroyuki %A Hayashi, Terumine %A Tsuruoka, Shinji %A Yoshikawa, Tomohiro %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 366-371 %T A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#ShinogiYHTY05 %@ 0-7695-2481-8

@inproceedings{conf/ats/ShinogiYHTY05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Shinogi, Tsuyoshi and Yamada, Hiroyuki and Hayashi, Terumine and Tsuruoka, Shinji and Yoshikawa, Tomohiro}, biburl = {https://www.bibsonomy.org/bibtex/2440d47c8c94fafb6c987fd348ff82de0/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.17}, interhash = {3eb01d74ac38c76e3c126087547a493c}, intrahash = {440d47c8c94fafb6c987fd348ff82de0}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {366-371}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#ShinogiYHTY05}, year = 2005 }