%0 Journal Article %1 journals/mr/WeulersseMASCG12 %A Weulersse, Cécile %A Miller, Florent %A Alexandrescu, Dan %A Schaefer, Erwin %A Crépel, Olivier %A Gaillard, Rémi %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2482-2486 %T Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#WeulersseMASCG12 %V 52

@article{journals/mr/WeulersseMASCG12, added-at = {2021-03-30T00:00:00.000+0200}, author = {Weulersse, Cécile and Miller, Florent and Alexandrescu, Dan and Schaefer, Erwin and Crépel, Olivier and Gaillard, Rémi}, biburl = {https://www.bibsonomy.org/bibtex/2123190e7e5250ffe9015b0a13a1f8feb/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.076}, interhash = {41147f72a20974d0dede85646799b2a9}, intrahash = {123190e7e5250ffe9015b0a13a1f8feb}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2482-2486}, timestamp = {2024-04-09T02:50:21.000+0200}, title = {Test methodology of a new upset mechanism induced by protons in deep sub-micron devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#WeulersseMASCG12}, volume = 52, year = 2012 }