%0 Conference Paper %1 conf/iscas/PontesOSRB22 %A Pontes, Matheus F. %A Oliveira, Ingrid F. V. %A Schvittz, Rafael B. %A da Rosa Jr., Leomar Soares %A Butzen, Paulo F. %B ISCAS %D 2022 %I IEEE %K dblp %P 1610-1614 %T The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2022.html#PontesOSRB22 %@ 978-1-6654-8485-5

@inproceedings{conf/iscas/PontesOSRB22, added-at = {2024-02-05T00:00:00.000+0100}, author = {Pontes, Matheus F. and Oliveira, Ingrid F. V. and Schvittz, Rafael B. and da Rosa Jr., Leomar Soares and Butzen, Paulo F.}, biburl = {https://www.bibsonomy.org/bibtex/22b908376da088aec666042c465d60c57/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2022}, ee = {https://doi.org/10.1109/ISCAS48785.2022.9937573}, interhash = {44c45eb5b2aded0a81fc593aecaccbe3}, intrahash = {2b908376da088aec666042c465d60c57}, isbn = {978-1-6654-8485-5}, keywords = {dblp}, pages = {1610-1614}, publisher = {IEEE}, timestamp = {2024-04-09T21:29:44.000+0200}, title = {The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2022.html#PontesOSRB22}, year = 2022 }