%0 Conference Paper %1 conf/cicc/DeguchiNKT17 %A Deguchi, Yoshiaki %A Nakamura, Toshiki %A Kobayashi, Atsuro %A Takeuchi, Ken %B CICC %D 2017 %I IEEE %K dblp %P 1-4 %T 12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2017.html#DeguchiNKT17 %@ 978-1-5090-5191-5

@inproceedings{conf/cicc/DeguchiNKT17, added-at = {2018-11-02T00:00:00.000+0100}, author = {Deguchi, Yoshiaki and Nakamura, Toshiki and Kobayashi, Atsuro and Takeuchi, Ken}, biburl = {https://www.bibsonomy.org/bibtex/28f578767aea31184b336d2f5ee2392ed/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2017}, ee = {https://doi.org/10.1109/CICC.2017.7993687}, interhash = {4f1312eb11c6c5240e0f2fbd424f5c77}, intrahash = {8f578767aea31184b336d2f5ee2392ed}, isbn = {978-1-5090-5191-5}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2019-10-17T23:07:27.000+0200}, title = {12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2017.html#DeguchiNKT17}, year = 2017 }