%0 Journal Article %1 journals/mr/LamhamdiPZBCGSPP08 %A Lamhamdi, Mohamed %A Pons, Patrick %A Zaghloul, Usama %A Boudou, Laurent %A Coccetti, Fabio %A Guastavino, Jean %A Segui, Y. %A Papaioannou, George J. %A Plana, Robert %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1248-1252 %T Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#LamhamdiPZBCGSPP08 %V 48

@article{journals/mr/LamhamdiPZBCGSPP08, added-at = {2023-12-07T00:00:00.000+0100}, author = {Lamhamdi, Mohamed and Pons, Patrick and Zaghloul, Usama and Boudou, Laurent and Coccetti, Fabio and Guastavino, Jean and Segui, Y. and Papaioannou, George J. and Plana, Robert}, biburl = {https://www.bibsonomy.org/bibtex/2e2618a9e6a9e86814c1035fe4860b603/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.07.017}, interhash = {4f2b532c773e021c8eb35be1930e453c}, intrahash = {e2618a9e6a9e86814c1035fe4860b603}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1248-1252}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#LamhamdiPZBCGSPP08}, volume = 48, year = 2008 }