Author of the publication

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.

, , , , , , , , and . Microelectron. Reliab., 48 (8-9): 1248-1252 (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor., , and . ICECS, page 902-905. IEEE, (2003)Charging-Effects in RF capacitive switches influence of insulating layers composition., , , , , , and . Microelectron. Reliab., 46 (9-11): 1700-1704 (2006)Biaxial initial stress characterization of bilayer gold RF-switches., , , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1776-1781 (2005)Wireless pressure measurement in air blast using PVDF sensors., , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2016)Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments., , , , , , , , , and 1 other author(s). Sensors, 23 (12): 5635 (2023)Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques., , , , , , and . Microelectron. Reliab., 50 (9-11): 1615-1620 (2010)Methods to improve reliability of bulge test technique to extract mechanical properties of thin films., , , , and . Microelectron. Reliab., 50 (9-11): 1888-1893 (2010)On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies., , , , , and . Microelectron. Reliab., 51 (9-11): 1810-1818 (2011)Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation., , , , , , , , and . Microelectron. Reliab., 48 (8-9): 1248-1252 (2008)Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1957-1962 (2003)