%0 Conference Paper %1 conf/ats/WeiWL96 %A Wei, Tao %A Wong, Mike W. T. %A Lee, Yim-Shu %B Asian Test Symposium %D 1996 %I IEEE Computer Society %K dblp %P 232-237 %T Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. %U http://dblp.uni-trier.de/db/conf/ats/ats1996.html#WeiWL96 %@ 0-8186-7478-4

@inproceedings{conf/ats/WeiWL96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wei, Tao and Wong, Mike W. T. and Lee, Yim-Shu}, biburl = {https://www.bibsonomy.org/bibtex/2e756e1d26a0f4e0076860a1a0d612ff3/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1996.555164}, interhash = {4fb36f49eb774fbcdf83f2c921c1298d}, intrahash = {e756e1d26a0f4e0076860a1a0d612ff3}, isbn = {0-8186-7478-4}, keywords = {dblp}, pages = {232-237}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:50.000+0200}, title = {Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1996.html#WeiWL96}, year = 1996 }