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Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.

, , and . Asian Test Symposium, page 232-237. IEEE Computer Society, (1996)

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Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis.. Asian Test Symposium, page 120-123. IEEE Computer Society, (2003)Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation., , and . Asian Test Symposium, page 232-237. IEEE Computer Society, (1996)Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis., , and . DELTA, page 443-446. IEEE Computer Society, (2002)Testing System-On-Chip by Summations of Cores? Test Output Voltages., , and . Asian Test Symposium, page 350-355. IEEE Computer Society, (2002)A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality., , and . ISQED, page 361-368. IEEE Computer Society, (2000)Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis., , and . J. Electron. Test., 9 (1-2): 153-163 (1996)Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits., , and . Asian Test Symposium, page 82-87. IEEE Computer Society, (1997)Analog circuit equivalent faults in the D.C. domain., , and . Asian Test Symposium, page 84-89. IEEE Computer Society, (2000)Design and Implementation of Self-Testable Full Range Window Comparator., and . Asian Test Symposium, page 314-318. IEEE Computer Society, (2004)Nonlinear circuit fault diagnosis with large change sensitivity., and . ICECS, page 225-228. IEEE, (1998)